Weakly Supervised Fine-grained Span-Level Framework for Chinese Radiology Report Quality Assurance.
Kaiyu Wang|Lin Mu|Zhiyao Yang|Ximing Li|Xiaotang Zhou|Wanfu Gao|Huimao Zhang
| Anthology ID: | DBLP:conf/cikm/WangMY0ZGZ25 |
|---|---|
| Volume: | Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025 |
| Year: | 2025 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 3020-3030 |
| URL: | https://doi.org/10.1145/3746252.3761022 |
| DOI: | https://doi.org/10.1145/3746252.3761022 |
| DBLP: | conf/cikm/WangMY0ZGZ25 |
| BibTeX: |
@inproceedings{wang-2025-weakly,
author = {Kaiyu Wang and
Lin Mu and
Zhiyao Yang and
Ximing Li and
Xiaotang Zhou and
Wanfu Gao and
Huimao Zhang},
editor = {Meeyoung Cha and
Carl Yang and
Senjuti Basu Roy and
Chanyoung Park and
Zhenhui Jessie Li and
Noseong Park and
Carl Yang and
Senjuti Basu Roy and
Zhenhui Jessie Li and
Jaap Kamps and
Kijung Shin and
Bryan Hooi and
Lifang He},
title = {{Weakly Supervised Fine-grained Span-Level Framework for Chinese Radiology Report Quality Assurance}},
booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}},
pages = {3020--3030},
publisher = {ACM},
year = {2025},
url = {https://doi.org/10.1145/3746252.3761022},
doi = {https://doi.org/10.1145/3746252.3761022}
}