Weakly Supervised Fine-grained Span-Level Framework for Chinese Radiology Report Quality Assurance.

Kaiyu Wang|Lin Mu|Zhiyao Yang|Ximing Li|Xiaotang Zhou|Wanfu Gao|Huimao Zhang


Anthology ID:DBLP:conf/cikm/WangMY0ZGZ25
Volume:Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025
Year:2025
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:3020-3030
URL:https://doi.org/10.1145/3746252.3761022
DOI:https://doi.org/10.1145/3746252.3761022
DBLP:conf/cikm/WangMY0ZGZ25
BibTeX:
@inproceedings{wang-2025-weakly, author = {Kaiyu Wang and Lin Mu and Zhiyao Yang and Ximing Li and Xiaotang Zhou and Wanfu Gao and Huimao Zhang}, editor = {Meeyoung Cha and Carl Yang and Senjuti Basu Roy and Chanyoung Park and Zhenhui Jessie Li and Noseong Park and Carl Yang and Senjuti Basu Roy and Zhenhui Jessie Li and Jaap Kamps and Kijung Shin and Bryan Hooi and Lifang He}, title = {{Weakly Supervised Fine-grained Span-Level Framework for Chinese Radiology Report Quality Assurance}}, booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}}, pages = {3020--3030}, publisher = {ACM}, year = {2025}, url = {https://doi.org/10.1145/3746252.3761022}, doi = {https://doi.org/10.1145/3746252.3761022} }