Robust Multi-Label Learning with Instance-Dependent Label Noise.

You Wu|Yabo Shi|Yizhang Zou|Peipei Li


Anthology ID:DBLP:conf/cikm/WuSZL25
Volume:Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025
Year:2025
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:3458-3467
URL:https://doi.org/10.1145/3746252.3761148
DOI:https://doi.org/10.1145/3746252.3761148
DBLP:conf/cikm/WuSZL25
BibTeX:
@inproceedings{wu-2025-robust, author = {You Wu and Yabo Shi and Yizhang Zou and Peipei Li}, editor = {Meeyoung Cha and Carl Yang and Senjuti Basu Roy and Chanyoung Park and Zhenhui Jessie Li and Noseong Park and Carl Yang and Senjuti Basu Roy and Zhenhui Jessie Li and Jaap Kamps and Kijung Shin and Bryan Hooi and Lifang He}, title = {{Robust Multi-Label Learning with Instance-Dependent Label Noise}}, booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}}, pages = {3458--3467}, publisher = {ACM}, year = {2025}, url = {https://doi.org/10.1145/3746252.3761148}, doi = {https://doi.org/10.1145/3746252.3761148} }