Robust Multi-Label Learning with Instance-Dependent Label Noise.
You Wu|Yabo Shi|Yizhang Zou|Peipei Li
| Anthology ID: | DBLP:conf/cikm/WuSZL25 |
|---|---|
| Volume: | Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025 |
| Year: | 2025 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 3458-3467 |
| URL: | https://doi.org/10.1145/3746252.3761148 |
| DOI: | https://doi.org/10.1145/3746252.3761148 |
| DBLP: | conf/cikm/WuSZL25 |
| BibTeX: |
@inproceedings{wu-2025-robust,
author = {You Wu and
Yabo Shi and
Yizhang Zou and
Peipei Li},
editor = {Meeyoung Cha and
Carl Yang and
Senjuti Basu Roy and
Chanyoung Park and
Zhenhui Jessie Li and
Noseong Park and
Carl Yang and
Senjuti Basu Roy and
Zhenhui Jessie Li and
Jaap Kamps and
Kijung Shin and
Bryan Hooi and
Lifang He},
title = {{Robust Multi-Label Learning with Instance-Dependent Label Noise}},
booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}},
pages = {3458--3467},
publisher = {ACM},
year = {2025},
url = {https://doi.org/10.1145/3746252.3761148},
doi = {https://doi.org/10.1145/3746252.3761148}
}