Metric-based ontology learning.

Luis Galárraga|Hui Yang|Guoliang Li|Guoliang Li|Jianhua Feng|Jamie Callan|Hui Yang|Jamie Callan|Jianhua Feng


Anthology ID:DBLP:conf/cikm/YangC08
Volume:Proceedings of the 2nd International Workshop on Ontologies and Information Systems for the Semantic Web, ONISW 2008, Napa Valley, California, USA, October 30, 2008
Year:2008
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:1-8
URL:https://doi.org/10.1145/1458484.1458486
DOI:https://doi.org/10.1145/1458484.1458486
DBLP:conf/cikm/YangC08
BibTeX:
@inproceedings{galarraga-2008-metricbased, author = {Luis Gal\'{a}rraga and Hui Yang and Guoliang Li and Guoliang Li and Jianhua Feng and Jamie Callan and Hui Yang and Jamie Callan and Jianhua Feng}, editor = {Hyoil Han and Ramez Elmasri and Martin Doerr and Mathias Brochhausen and Hyoil Han}, title = {{Metric-based ontology learning}}, booktitle = {{Proceedings of the 2nd International Workshop on Ontologies and Information Systems for the Semantic Web, ONISW 2008, Napa Valley, California, USA, October 30, 2008}}, pages = {1--8}, publisher = {ACM}, year = {2008}, url = {https://doi.org/10.1145/1458484.1458486}, doi = {https://doi.org/10.1145/1458484.1458486} }