Look Twice as Much as You Say: Scene Graph Contrastive Learning for Self-Supervised Image Caption Generation.

Chunhui Zhang|Chao Huang|Youhuan Li|Xiangliang Zhang|Yanfang Ye|Chuxu Zhang


Anthology ID:DBLP:conf/cikm/Zhang0L00Z22
Volume:Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022
Year:2022
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:2519-2528
URL:https://doi.org/10.1145/3511808.3557382
DOI:https://doi.org/10.1145/3511808.3557382
DBLP:conf/cikm/Zhang0L00Z22
BibTeX:
@inproceedings{zhang-2022-look, author = {Chunhui Zhang and Chao Huang and Youhuan Li and Xiangliang Zhang and Yanfang Ye and Chuxu Zhang}, editor = {Mohammad Al Hasan and Li Xiong}, title = {{Look Twice as Much as You Say: Scene Graph Contrastive Learning for Self-Supervised Image Caption Generation}}, booktitle = {{Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022}}, pages = {2519--2528}, publisher = {ACM}, year = {2022}, url = {https://doi.org/10.1145/3511808.3557382}, doi = {https://doi.org/10.1145/3511808.3557382} }