Look Twice as Much as You Say: Scene Graph Contrastive Learning for Self-Supervised Image Caption Generation.
Chunhui Zhang|Chao Huang|Youhuan Li|Xiangliang Zhang|Yanfang Ye|Chuxu Zhang
| Anthology ID: | DBLP:conf/cikm/Zhang0L00Z22 |
|---|---|
| Volume: | Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022 |
| Year: | 2022 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 2519-2528 |
| URL: | https://doi.org/10.1145/3511808.3557382 |
| DOI: | https://doi.org/10.1145/3511808.3557382 |
| DBLP: | conf/cikm/Zhang0L00Z22 |
| BibTeX: |
@inproceedings{zhang-2022-look,
author = {Chunhui Zhang and
Chao Huang and
Youhuan Li and
Xiangliang Zhang and
Yanfang Ye and
Chuxu Zhang},
editor = {Mohammad Al Hasan and
Li Xiong},
title = {{Look Twice as Much as You Say: Scene Graph Contrastive Learning for Self-Supervised Image Caption Generation}},
booktitle = {{Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022}},
pages = {2519--2528},
publisher = {ACM},
year = {2022},
url = {https://doi.org/10.1145/3511808.3557382},
doi = {https://doi.org/10.1145/3511808.3557382}
}