Intrinsic Plagiarism Detection.

Sven Meyer zu Eissen|Benno Stein


Anthology ID:DBLP:conf/ecir/EissenS06
Volume:Advances in Information Retrieval, 28th European Conference on IR Research, ECIR 2006, London, UK, April 10-12, 2006, Proceedings
Year:2006
Venue:European Conference on Advances in Information Retrieval (ECIR)
Publisher:Springer
Pages:565-569
URL:https://doi.org/10.1007/11735106_66
DOI:https://doi.org/10.1007/11735106_66
DBLP:conf/ecir/EissenS06
BibTeX:
@inproceedings{eissen-2006-intrinsic, author = {Sven Meyer zu Eissen and Benno Stein}, editor = {Mounia Lalmas-Roelleke and Andrew MacFarlane and Stefan M. R\"{u}ger and Anastasios Tombros and Theodora Tsikrika and Alexei Yavlinsky}, title = {{Intrinsic Plagiarism Detection}}, booktitle = {{Advances in Information Retrieval, 28th European Conference on IR Research, ECIR 2006, London, UK, April 10-12, 2006, Proceedings}}, series = {Lecture Notes in Computer Science}, volume = {3936}, pages = {565--569}, publisher = {Springer}, year = {2006}, url = {https://doi.org/10.1007/11735106_66}, doi = {https://doi.org/10.1007/11735106_66} }