Tolerance of Effectiveness Measures to Relevance Judging Errors.

Le Li|Mark D. Smucker


Anthology ID:DBLP:conf/ecir/LiS14
Volume:Advances in Information Retrieval - 36th European Conference on IR Research, ECIR 2014, Amsterdam, The Netherlands, April 13-16, 2014. Proceedings
Year:2014
Venue:European Conference on Advances in Information Retrieval (ECIR)
Publisher:Springer
Pages:148-159
URL:https://doi.org/10.1007/978-3-319-06028-6_13
DOI:https://doi.org/10.1007/978-3-319-06028-6_13
DBLP:conf/ecir/LiS14
BibTeX:
@inproceedings{li-2014-tolerance, author = {Le Li and Mark D. Smucker}, editor = {Maarten de Rijke and Arjen P. de Vries and Tom Kenter and Arjen P. de Vries and ChengXiang Zhai and Arjen P. de Vries and Maarten de Rijke and Franciska de Jong and Kira Radinsky and Katja Hofmann}, title = {{Tolerance of Effectiveness Measures to Relevance Judging Errors}}, booktitle = {{Advances in Information Retrieval - 36th European Conference on IR Research, ECIR 2014, Amsterdam, The Netherlands, April 13-16, 2014. Proceedings}}, series = {Lecture Notes in Computer Science}, volume = {8416}, pages = {148--159}, publisher = {Springer}, year = {2014}, url = {https://doi.org/10.1007/978-3-319-06028-6_13}, doi = {https://doi.org/10.1007/978-3-319-06028-6_13} }