A Surface-Similarity Based Two-Step Classifier for RITE-VAL.

Shohei Hattori|Satoshi Sato


Anthology ID:DBLP:conf/ntcir/HattoriS14
Volume:Proceedings of the 11th NTCIR Conference on Evaluation of Information Access Technologies, NTCIR-11, National Center of Sciences, Tokyo, Japan, December 9-12, 2014
Year:2014
Venue:NTCIR Conference on Evaluation of Information Access Technologies (NTCIR)
Publisher:National Institute of Informatics (NII)
URL:http://research.nii.ac.jp/ntcir/workshop/OnlineProceedings11/pdf/NTCIR/RITEVAL/07-NTCIR11-RITEVAL-HattoriS.pdf
DBLP:conf/ntcir/HattoriS14
BibTeX:
@inproceedings{hattori-2014-surfacesimilarity, author = {Shohei Hattori and Satoshi Sato}, editor = {Noriko Kando and Hideo Joho and Kazuaki Kishida}, title = {{A Surface-Similarity Based Two-Step Classifier for RITE-VAL}}, booktitle = {{Proceedings of the 11th NTCIR Conference on Evaluation of Information Access Technologies, NTCIR-11, National Center of Sciences, Tokyo, Japan, December 9-12, 2014}}, publisher = {National Institute of Informatics (NII)}, year = {2014}, url = {http://research.nii.ac.jp/ntcir/workshop/OnlineProceedings11/pdf/NTCIR/RITEVAL/07-NTCIR11-RITEVAL-HattoriS.pdf} }