Exploring the Impact of Negative Sampling on Patent Citation Recommendation.

Rima Dessi|Hidir Aras|Mehwish Alam


Anthology ID:DBLP:conf/patentsemtech/DessiAA23
Volume:Proceedings of the 4th Workshop on Patent Text Mining and Semantic Technologies (PatentSemTech) 2023 co-located with the 46th International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR 2023), Taipeh, Taiwan, July 27th, 2023.
Year:2023
Venue:Workshop on Patent Text Mining and Semantic Technologies (PatentSemTech)
Publisher:CEUR-WS.org
Pages:39-43
URL:https://ceur-ws.org/Vol-3604/paper3.pdf
DBLP:conf/patentsemtech/DessiAA23
BibTeX:
@inproceedings{dessi-2023-exploring, author = {Rima Dessi and Hidir Aras and Mehwish Alam}, editor = {Hidir Aras and Ralf Krestel and Linda Andersson and Florina Piroi and Allan Hanbury and Dean Alderucci}, title = {{Exploring the Impact of Negative Sampling on Patent Citation Recommendation}}, booktitle = {{Proceedings of the 4th Workshop on Patent Text Mining and Semantic Technologies (PatentSemTech) 2023 co-located with the 46th International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR 2023), Taipeh, Taiwan, July 27th, 2023}}, series = {CEUR Workshop Proceedings}, volume = {3604}, pages = {39--43}, publisher = {CEUR-WS.org}, year = {2023}, url = {https://ceur-ws.org/Vol-3604/paper3.pdf} }