Testing algorithms is like testing students.

David Bodoff|Pu Li


Anthology ID:DBLP:conf/sigir/BodoffL05
Volume:SIGIR 2005: Proceedings of the 28th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Salvador, Brazil, August 15-19, 2005
Year:2005
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:589-590
URL:https://doi.org/10.1145/1076034.1076142
DOI:https://doi.org/10.1145/1076034.1076142
DBLP:conf/sigir/BodoffL05
BibTeX:
@inproceedings{bodoff-2005-testing, author = {David Bodoff and Pu Li}, editor = {Ricardo Baeza-Yates and Nivio Ziviani and Gary Marchionini and Alistair Moffat and John Tait}, title = {{Testing algorithms is like testing students}}, booktitle = {{SIGIR 2005: Proceedings of the 28th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Salvador, Brazil, August 15-19, 2005}}, pages = {589--590}, publisher = {ACM}, year = {2005}, url = {https://doi.org/10.1145/1076034.1076142}, doi = {https://doi.org/10.1145/1076034.1076142} }