Test theory for assessing IR test collections.

David Bodoff|Pu Li


Anthology ID:DBLP:conf/sigir/BodoffL07
Volume:SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007
Year:2007
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:367-374
URL:https://doi.org/10.1145/1277741.1277805
DOI:https://doi.org/10.1145/1277741.1277805
DBLP:conf/sigir/BodoffL07
BibTeX:
@inproceedings{bodoff-2007-test, author = {David Bodoff and Pu Li}, editor = {Wessel Kraaij and Arjen P. de Vries and Charles L. A. Clarke and Norbert Fuhr and Noriko Kando}, title = {{Test theory for assessing IR test collections}}, booktitle = {{SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007}}, pages = {367--374}, publisher = {ACM}, year = {2007}, url = {https://doi.org/10.1145/1277741.1277805}, doi = {https://doi.org/10.1145/1277741.1277805} }