TREC Deep Learning Track: Reusable Test Collections in the Large Data Regime.

Nick Craswell|Bhaskar Mitra|Emine Yilmaz|Daniel Campos|Ellen M. Voorhees|Ian Soboroff


Anthology ID:DBLP:conf/sigir/CraswellMYCVS21
Volume:SIGIR '21: The 44th International ACM SIGIR Conference on Research and Development in Information Retrieval, Virtual Event, Canada, July 11-15, 2021
Year:2021
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:2369-2375
URL:https://doi.org/10.1145/3404835.3463249
DOI:https://doi.org/10.1145/3404835.3463249
DBLP:conf/sigir/CraswellMYCVS21
BibTeX:
@inproceedings{craswell-2021-trec, author = {Nick Craswell and Bhaskar Mitra and Emine Yilmaz and Daniel Campos and Ellen M. Voorhees and Ian Soboroff}, editor = {Fernando Diaz and Chirag Shah and Torsten Suel and Pablo Castells and Rosie Jones and Tetsuya Sakai}, title = {{TREC Deep Learning Track: Reusable Test Collections in the Large Data Regime}}, booktitle = {{SIGIR '21: The 44th International ACM SIGIR Conference on Research and Development in Information Retrieval, Virtual Event, Canada, July 11-15, 2021}}, pages = {2369--2375}, publisher = {ACM}, year = {2021}, url = {https://doi.org/10.1145/3404835.3463249}, doi = {https://doi.org/10.1145/3404835.3463249} }