A Horizontal Patent Test Collection.

Mihai Lupu|Alexandros Bampoulidis|Luca Papariello


Anthology ID:DBLP:conf/sigir/LupuBP19
Volume:Proceedings of the 42nd International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2019, Paris, France, July 21-25, 2019.
Year:2019
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:1213-1216
URL:https://doi.org/10.1145/3331184.3331346
DOI:https://doi.org/10.1145/3331184.3331346
DBLP:conf/sigir/LupuBP19
BibTeX:
@inproceedings{lupu-2019-horizontal, author = {Mihai Lupu and Alexandros Bampoulidis and Luca Papariello}, editor = {Benjamin Piwowarski and Max Chevalier and \'{E}ric Gaussier and Yoelle Maarek and Jian-Yun Nie and Falk Scholer}, title = {{A Horizontal Patent Test Collection}}, booktitle = {{Proceedings of the 42nd International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2019, Paris, France, July 21-25, 2019}}, pages = {1213--1216}, publisher = {ACM}, year = {2019}, url = {https://doi.org/10.1145/3331184.3331346}, doi = {https://doi.org/10.1145/3331184.3331346} }