On Fine-Grained Relevance Scales.

Kevin Roitero|Eddy Maddalena|Gianluca Demartini|Stefano Mizzaro


Anthology ID:DBLP:conf/sigir/RoiteroMDM18
Volume:The 41st International ACM SIGIR Conference on Research & Development in Information Retrieval, SIGIR 2018, Ann Arbor, MI, USA, July 08-12, 2018
Year:2018
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:675-684
URL:https://doi.org/10.1145/3209978.3210052
DOI:https://doi.org/10.1145/3209978.3210052
DBLP:conf/sigir/RoiteroMDM18
BibTeX:
@inproceedings{roitero-2018-finegrained, author = {Kevin Roitero and Eddy Maddalena and Gianluca Demartini and Stefano Mizzaro}, editor = {Kevyn Collins-Thompson and Qiaozhu Mei and Brian D. Davison and Yiqun Liu and Emine Yilmaz}, title = {{On Fine-Grained Relevance Scales}}, booktitle = {{The 41st International ACM SIGIR Conference on Research & Development in Information Retrieval, SIGIR 2018, Ann Arbor, MI, USA, July 08-12, 2018}}, pages = {675--684}, publisher = {ACM}, year = {2018}, url = {https://doi.org/10.1145/3209978.3210052}, doi = {https://doi.org/10.1145/3209978.3210052} }