On Fine-Grained Relevance Scales.
Kevin Roitero|Eddy Maddalena|Gianluca Demartini|Stefano Mizzaro
| Anthology ID: | DBLP:conf/sigir/RoiteroMDM18 |
|---|---|
| Volume: | The 41st International ACM SIGIR Conference on Research & Development in Information Retrieval, SIGIR 2018, Ann Arbor, MI, USA, July 08-12, 2018 |
| Year: | 2018 |
| Venue: | Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR) |
| Publisher: | ACM |
| Pages: | 675-684 |
| URL: | https://doi.org/10.1145/3209978.3210052 |
| DOI: | https://doi.org/10.1145/3209978.3210052 |
| DBLP: | conf/sigir/RoiteroMDM18 |
| BibTeX: |
@inproceedings{roitero-2018-finegrained,
author = {Kevin Roitero and
Eddy Maddalena and
Gianluca Demartini and
Stefano Mizzaro},
editor = {Kevyn Collins-Thompson and
Qiaozhu Mei and
Brian D. Davison and
Yiqun Liu and
Emine Yilmaz},
title = {{On Fine-Grained Relevance Scales}},
booktitle = {{The 41st International ACM SIGIR Conference on Research & Development in Information Retrieval, SIGIR 2018, Ann Arbor, MI, USA, July 08-12, 2018}},
pages = {675--684},
publisher = {ACM},
year = {2018},
url = {https://doi.org/10.1145/3209978.3210052},
doi = {https://doi.org/10.1145/3209978.3210052}
}