Two Sample T-tests for IR Evaluation: Student or Welch?
| Anthology ID: | DBLP:conf/sigir/Sakai16a |
|---|---|
| Volume: | Proceedings of the 39th International ACM SIGIR conference on Research and Development in Information Retrieval, SIGIR 2016, Pisa, Italy, July 17-21, 2016 |
| Year: | 2016 |
| Venue: | Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR) |
| Publisher: | ACM |
| Pages: | 1045-1048 |
| URL: | https://doi.org/10.1145/2911451.2914684 |
| DOI: | https://doi.org/10.1145/2911451.2914684 |
| DBLP: | conf/sigir/Sakai16a |
| BibTeX: |
@inproceedings{sakai-2016-two,
author = {Tetsuya Sakai},
editor = {Raffaele Perego and
Fabrizio Sebastiani and
Javed A. Aslam and
Ian Ruthven and
Justin Zobel},
title = {{Two Sample T-tests for IR Evaluation: Student or Welch?}},
booktitle = {{Proceedings of the 39th International ACM SIGIR conference on Research and Development in Information Retrieval, SIGIR 2016, Pisa, Italy, July 17-21, 2016}},
pages = {1045--1048},
publisher = {ACM},
year = {2016},
url = {https://doi.org/10.1145/2911451.2914684},
doi = {https://doi.org/10.1145/2911451.2914684}
}