Quantifying test collection quality based on the consistency of relevance judgements.

Falk Scholer|Andrew Turpin|Mark Sanderson


Anthology ID:DBLP:conf/sigir/ScholerTS11
Volume:Proceeding of the 34th International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2011, Beijing, China, July 25-29, 2011
Year:2011
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:1063-1072
URL:https://doi.org/10.1145/2009916.2010057
DOI:https://doi.org/10.1145/2009916.2010057
DBLP:conf/sigir/ScholerTS11
BibTeX:
@inproceedings{scholer-2011-quantifying, author = {Falk Scholer and Andrew Turpin and Mark Sanderson}, editor = {Wei-Ying Ma and Jian-Yun Nie and Ricardo Baeza-Yates and Tat-Seng Chua and W. Bruce Croft}, title = {{Quantifying test collection quality based on the consistency of relevance judgements}}, booktitle = {{Proceeding of the 34th International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2011, Beijing, China, July 25-29, 2011}}, pages = {1063--1072}, publisher = {ACM}, year = {2011}, url = {https://doi.org/10.1145/2009916.2010057}, doi = {https://doi.org/10.1145/2009916.2010057} }