Machine Learning Powered A/B Testing.

Pavel Serdyukov


Anthology ID:DBLP:conf/sigir/Serdyukov17
Volume:Proceedings of the 40th International ACM SIGIR Conference on Research and Development in Information Retrieval, Shinjuku, Tokyo, Japan, August 7-11, 2017
Year:2017
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:1365
URL:https://doi.org/10.1145/3077136.3096468
DOI:https://doi.org/10.1145/3077136.3096468
DBLP:conf/sigir/Serdyukov17
BibTeX:
@inproceedings{serdyukov-2017-machine, author = {Pavel Serdyukov}, editor = {Noriko Kando and Tetsuya Sakai and Hideo Joho and Hang Li and Arjen P. de Vries and Ryen W. White}, title = {{Machine Learning Powered A/B Testing}}, booktitle = {{Proceedings of the 40th International ACM SIGIR Conference on Research and Development in Information Retrieval, Shinjuku, Tokyo, Japan, August 7-11, 2017}}, pages = {1365}, publisher = {ACM}, year = {2017}, url = {https://doi.org/10.1145/3077136.3096468}, doi = {https://doi.org/10.1145/3077136.3096468} }