Too Many Relevants: Whither Cranfield Test Collections?
Ellen M. Voorhees|Nick Craswell|Jimmy Lin
| Anthology ID: | DBLP:conf/sigir/VoorheesCL22 |
|---|---|
| Volume: | SIGIR '22: The 45th International ACM SIGIR Conference on Research and Development in Information Retrieval, Madrid, Spain, July 11 - 15, 2022 |
| Year: | 2022 |
| Venue: | Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR) |
| Publisher: | ACM |
| Pages: | 2970-2980 |
| URL: | https://doi.org/10.1145/3477495.3531728 |
| DOI: | https://doi.org/10.1145/3477495.3531728 |
| DBLP: | conf/sigir/VoorheesCL22 |
| BibTeX: |
@inproceedings{voorhees-2022-many,
author = {Ellen M. Voorhees and
Nick Craswell and
Jimmy Lin},
editor = {Enrique Amig\'{o} and
Pablo Castells and
Julio Gonzalo and
Ben Carterette and
J. Shane Culpepper and
Gabriella Kazai},
title = {{Too Many Relevants: Whither Cranfield Test Collections?}},
booktitle = {{SIGIR '22: The 45th International ACM SIGIR Conference on Research and Development in Information Retrieval, Madrid, Spain, July 11 - 15, 2022}},
pages = {2970--2980},
publisher = {ACM},
year = {2022},
url = {https://doi.org/10.1145/3477495.3531728},
doi = {https://doi.org/10.1145/3477495.3531728}
}