PatentMerit: A Holistic System for In-depth Technology Understanding.

Peter Ingwersen|Tianxiang Xie|Jingxuan Wu|Douglas W. Oard|Jiaying Liu|Peter Ingwersen|Tianxiang Xie|Douglas W. Oard|Jiaying Liu|Junxiang Zhang|Shuo Yu


Anthology ID:DBLP:conf/sigir/XieWLZY26
Volume:Proceedings of the 49th International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2026, MelbourneVICAustralia, July 20-24, 2026
Year:2026
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:5240-5244
URL:https://doi.org/10.1145/3805712.3808377
DOI:https://doi.org/10.1145/3805712.3808377
DBLP:conf/sigir/XieWLZY26
BibTeX:
@inproceedings{ingwersen-2026-patentmerit, author = {Peter Ingwersen and Tianxiang Xie and Jingxuan Wu and Douglas W. Oard and Jiaying Liu and Peter Ingwersen and Tianxiang Xie and Douglas W. Oard and Jiaying Liu and Junxiang Zhang and Shuo Yu}, editor = {Hannah Bast and Alistair Moffat and Falk Scholer and Marc Najork and Min Zhang and Hannah Bast and Marc Najork and Min Zhang}, title = {{PatentMerit: A Holistic System for In-depth Technology Understanding}}, booktitle = {{Proceedings of the 49th International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR 2026, MelbourneVICAustralia, July 20-24, 2026}}, pages = {5240--5244}, publisher = {ACM}, year = {2026}, url = {https://doi.org/10.1145/3805712.3808377}, doi = {https://doi.org/10.1145/3805712.3808377} }