On the Reliability of Test Collections for Evaluating Systems of Different Types.

Emine Yilmaz|Nick Craswell|Bhaskar Mitra|Daniel Campos


Anthology ID:DBLP:conf/sigir/YilmazCMC20
Volume:Proceedings of the 43rd International ACM SIGIR conference on research and development in Information Retrieval, SIGIR 2020, Virtual Event, China, July 25-30, 2020
Year:2020
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:2101-2104
URL:https://doi.org/10.1145/3397271.3401317
DOI:https://doi.org/10.1145/3397271.3401317
DBLP:conf/sigir/YilmazCMC20
BibTeX:
@inproceedings{yilmaz-2020-reliability, author = {Emine Yilmaz and Nick Craswell and Bhaskar Mitra and Daniel Campos}, editor = {Jimmy Huang and Yi Chang and Xueqi Cheng and Jaap Kamps and Vanessa Murdock and Ji-Rong Wen and Yiqun Liu}, title = {{On the Reliability of Test Collections for Evaluating Systems of Different Types}}, booktitle = {{Proceedings of the 43rd International ACM SIGIR conference on research and development in Information Retrieval, SIGIR 2020, Virtual Event, China, July 25-30, 2020}}, pages = {2101--2104}, publisher = {ACM}, year = {2020}, url = {https://doi.org/10.1145/3397271.3401317}, doi = {https://doi.org/10.1145/3397271.3401317} }