Automatically Extracting High-Quality Negative Examples for Answer Selection in Question Answering.

Haotian Zhang|Jinfeng Rao|Jimmy Lin|Mark D. Smucker


Anthology ID:DBLP:conf/sigir/ZhangRLS17
Volume:Proceedings of the 40th International ACM SIGIR Conference on Research and Development in Information Retrieval, Shinjuku, Tokyo, Japan, August 7-11, 2017
Year:2017
Venue:Annual International ACM SIGIR Conference on Research and Development in Information Retrieval (SIGIR)
Publisher:ACM
Pages:797-800
URL:https://doi.org/10.1145/3077136.3080645
DOI:https://doi.org/10.1145/3077136.3080645
DBLP:conf/sigir/ZhangRLS17
BibTeX:
@inproceedings{zhang-2017-automatically, author = {Haotian Zhang and Jinfeng Rao and Jimmy Lin and Mark D. Smucker}, editor = {Noriko Kando and Tetsuya Sakai and Hideo Joho and Hang Li and Arjen P. de Vries and Ryen W. White}, title = {{Automatically Extracting High-Quality Negative Examples for Answer Selection in Question Answering}}, booktitle = {{Proceedings of the 40th International ACM SIGIR Conference on Research and Development in Information Retrieval, Shinjuku, Tokyo, Japan, August 7-11, 2017}}, pages = {797--800}, publisher = {ACM}, year = {2017}, url = {https://doi.org/10.1145/3077136.3080645}, doi = {https://doi.org/10.1145/3077136.3080645} }