Locating Faulty Applications via Semantic and Topology Estimation.

Shuyi Niu|Jiawei Jin|Xiutian Huang|Yonggeng Wang|Wenhao Xu|Youyong Kong


Anthology ID:DBLP:conf/www/NiuJHWXK23
Volume:Companion Proceedings of the ACM Web Conference 2023, WWW 2023, Austin, TX, USA, 30 April 2023 - 4 May 2023
Year:2023
Venue:The Web Conference (WWW)
Publisher:ACM
Pages:528-532
URL:https://doi.org/10.1145/3543873.3584660
DOI:https://doi.org/10.1145/3543873.3584660
DBLP:conf/www/NiuJHWXK23
BibTeX:
@inproceedings{niu-2023-locating, author = {Shuyi Niu and Jiawei Jin and Xiutian Huang and Yonggeng Wang and Wenhao Xu and Youyong Kong}, editor = {Ying Ding and Jie Tang and Juan F. Sequeda and Lora Aroyo and Carlos Castillo and Geert-Jan Houben}, title = {{Locating Faulty Applications via Semantic and Topology Estimation}}, booktitle = {{Companion Proceedings of the ACM Web Conference 2023, WWW 2023, Austin, TX, USA, 30 April 2023 - 4 May 2023}}, pages = {528--532}, publisher = {ACM}, year = {2023}, url = {https://doi.org/10.1145/3543873.3584660}, doi = {https://doi.org/10.1145/3543873.3584660} }