Locating Faulty Applications via Semantic and Topology Estimation.
Shuyi Niu|Jiawei Jin|Xiutian Huang|Yonggeng Wang|Wenhao Xu|Youyong Kong
| Anthology ID: | DBLP:conf/www/NiuJHWXK23 |
|---|---|
| Volume: | Companion Proceedings of the ACM Web Conference 2023, WWW 2023, Austin, TX, USA, 30 April 2023 - 4 May 2023 |
| Year: | 2023 |
| Venue: | The Web Conference (WWW) |
| Publisher: | ACM |
| Pages: | 528-532 |
| URL: | https://doi.org/10.1145/3543873.3584660 |
| DOI: | https://doi.org/10.1145/3543873.3584660 |
| DBLP: | conf/www/NiuJHWXK23 |
| BibTeX: |
@inproceedings{niu-2023-locating,
author = {Shuyi Niu and
Jiawei Jin and
Xiutian Huang and
Yonggeng Wang and
Wenhao Xu and
Youyong Kong},
editor = {Ying Ding and
Jie Tang and
Juan F. Sequeda and
Lora Aroyo and
Carlos Castillo and
Geert-Jan Houben},
title = {{Locating Faulty Applications via Semantic and Topology Estimation}},
booktitle = {{Companion Proceedings of the ACM Web Conference 2023, WWW 2023, Austin, TX, USA, 30 April 2023 - 4 May 2023}},
pages = {528--532},
publisher = {ACM},
year = {2023},
url = {https://doi.org/10.1145/3543873.3584660},
doi = {https://doi.org/10.1145/3543873.3584660}
}