Comparative Analysis of Machine Learning-Based Algorithms for Detection of Anomalies in IIoT.
Bhupal Naik D. S.|Venkatesulu Dondeti|Sivadi Balakrishna
| Anthology ID: | DBLP:journals/ijirr/SDB22 |
|---|---|
| Year: | 2022 |
| Venue: | International Journal of Information Retrieval Research (IJIRR) |
| Pages: | 1-55 |
| URL: | https://doi.org/10.4018/IJIRR.298647 |
| DOI: | https://doi.org/10.4018/IJIRR.298647 |
| DBLP: | journals/ijirr/SDB22 |
| BibTeX: |
@article{s-2022-comparative,
author = {Bhupal Naik D. S. and
Venkatesulu Dondeti and
Sivadi Balakrishna},
title = {{Comparative Analysis of Machine Learning-Based Algorithms for Detection of Anomalies in IIoT}},
journal = {International Journal of Information Retrieval Research (IJIRR)},
volume = {12},
number = {1},
pages = {1--55},
year = {2022},
url = {https://doi.org/10.4018/IJIRR.298647},
doi = {https://doi.org/10.4018/IJIRR.298647}
}