Test theory for evaluating reliability of IR test collections.

David Bodoff


Anthology ID:DBLP:journals/ipm/Bodoff08
Year:2008
Venue:Information Processing and Management
Pages:1117-1145
URL:https://doi.org/10.1016/J.IPM.2007.11.006
DOI:https://doi.org/10.1016/J.IPM.2007.11.006
DBLP:journals/ipm/Bodoff08
BibTeX:
@article{bodoff-2008-test, author = {David Bodoff}, title = {{Test theory for evaluating reliability of IR test collections}}, journal = {Information Processing and Management}, volume = {44}, number = {3}, pages = {1117--1145}, year = {2008}, url = {https://doi.org/10.1016/J.IPM.2007.11.006}, doi = {https://doi.org/10.1016/J.IPM.2007.11.006} }