Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test.
Se Young Kim|Hahyeon Park|Hongbum Kim|Joon Kim|Kyoungwon Seo
| Anthology ID: | DBLP:journals/ipm/KimPKKS22 |
|---|---|
| Year: | 2022 |
| Venue: | Information Processing and Management |
| Pages: | 103093 |
| URL: | https://doi.org/10.1016/J.IPM.2022.103093 |
| DOI: | https://doi.org/10.1016/J.IPM.2022.103093 |
| DBLP: | journals/ipm/KimPKKS22 |
| BibTeX: |
@article{kim-2022-technostress,
author = {Se Young Kim and
Hahyeon Park and
Hongbum Kim and
Joon Kim and
Kyoungwon Seo},
title = {{Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test}},
journal = {Information Processing and Management},
volume = {59},
number = {6},
pages = {103093},
year = {2022},
url = {https://doi.org/10.1016/J.IPM.2022.103093},
doi = {https://doi.org/10.1016/J.IPM.2022.103093}
}