Technological trend mining: identifying new technology opportunities using patent semantic analysis.

Siyeong Yun|Woojin Cho|Chulhyun Kim|Sungjoo Lee


Anthology ID:DBLP:journals/ipm/YunCKL22
Year:2022
Venue:Information Processing and Management
Pages:102993
URL:https://doi.org/10.1016/J.IPM.2022.102993
DOI:https://doi.org/10.1016/J.IPM.2022.102993
DBLP:journals/ipm/YunCKL22
BibTeX:
@article{yun-2022-technological, author = {Siyeong Yun and Woojin Cho and Chulhyun Kim and Sungjoo Lee}, title = {{Technological trend mining: identifying new technology opportunities using patent semantic analysis}}, journal = {Information Processing and Management}, volume = {59}, number = {4}, pages = {102993}, year = {2022}, url = {https://doi.org/10.1016/J.IPM.2022.102993}, doi = {https://doi.org/10.1016/J.IPM.2022.102993} }