Test collection reliability: a study of bias and robustness to statistical assumptions via stochastic simulation.

Julián Urbano


Anthology ID:DBLP:journals/ir/Urbano16
Year:2016
Venue:Discover Computing
Pages:313-350
URL:https://doi.org/10.1007/S10791-015-9274-Y
DOI:https://doi.org/10.1007/S10791-015-9274-Y
DBLP:journals/ir/Urbano16
BibTeX:
@article{urbano-2016-test, author = {Juli\'{a}n Urbano}, title = {{Test collection reliability: a study of bias and robustness to statistical assumptions via stochastic simulation}}, journal = {Discover Computing}, volume = {19}, number = {3}, pages = {313--350}, year = {2016}, url = {https://doi.org/10.1007/S10791-015-9274-Y}, doi = {https://doi.org/10.1007/S10791-015-9274-Y} }