Measuring technological distance for patent mapping.
| Anthology ID: | DBLP:journals/jasis/YanL17 |
|---|---|
| Year: | 2017 |
| Venue: | Journal of the Association for Information Science and Technology (JASIST) |
| Pages: | 423-437 |
| URL: | https://doi.org/10.1002/ASI.23664 |
| DOI: | https://doi.org/10.1002/ASI.23664 |
| DBLP: | journals/jasis/YanL17 |
| BibTeX: |
@article{yan-2017-measuring,
author = {Bowen Yan and
Jianxi Luo},
title = {{Measuring technological distance for patent mapping}},
journal = {Journal of the Association for Information Science and Technology (JASIST)},
volume = {68},
number = {2},
pages = {423--437},
year = {2017},
url = {https://doi.org/10.1002/ASI.23664},
doi = {https://doi.org/10.1002/ASI.23664}
}