One size does not fit all: A study of badge behavior in stack overflow.

Stav Yanovsky|Nicholas Hoernle|Omer Lev|Kobi Gal


Anthology ID:DBLP:journals/jasis/YanovskyHLG21
Year:2021
Venue:Journal of the Association for Information Science and Technology (JASIST)
Pages:331-345
URL:https://doi.org/10.1002/ASI.24409
DOI:https://doi.org/10.1002/ASI.24409
DBLP:journals/jasis/YanovskyHLG21
BibTeX:
@article{yanovsky-2021-one, author = {Stav Yanovsky and Nicholas Hoernle and Omer Lev and Kobi Gal}, title = {{One size does not fit all: A study of badge behavior in stack overflow}}, journal = {Journal of the Association for Information Science and Technology (JASIST)}, volume = {72}, number = {3}, pages = {331--345}, year = {2021}, url = {https://doi.org/10.1002/ASI.24409}, doi = {https://doi.org/10.1002/ASI.24409} }