Using Clustering and Metric Learning to Improve Science Return of Remote Sensed Imagery.

David S. Hayden|Steve A. Chien|David R. Thompson|Rebecca Castaño


Anthology ID:DBLP:journals/tist/HaydenCTC12
Year:2012
Venue:ACM Transactions on Intelligent Systems and Technology (TIST)
Pages:51:1-51:19
URL:https://doi.org/10.1145/2168752.2168765
DOI:https://doi.org/10.1145/2168752.2168765
DBLP:journals/tist/HaydenCTC12
BibTeX:
@article{hayden-2012-using, author = {David S. Hayden and Steve A. Chien and David R. Thompson and Rebecca Casta\~{n}o}, title = {{Using Clustering and Metric Learning to Improve Science Return of Remote Sensed Imagery}}, journal = {ACM Transactions on Intelligent Systems and Technology (TIST)}, volume = {3}, number = {3}, pages = {51:1--51:19}, year = {2012}, url = {https://doi.org/10.1145/2168752.2168765}, doi = {https://doi.org/10.1145/2168752.2168765} }