Distance metric learning from uncertain side information for automated photo tagging.
Lei Wu|Steven C. H. Hoi|Rong Jin|Jianke Zhu|Nenghai Yu
| Anthology ID: | DBLP:journals/tist/WuHJZY11 |
|---|---|
| Year: | 2011 |
| Venue: | ACM Transactions on Intelligent Systems and Technology (TIST) |
| Pages: | 13:1-13:28 |
| URL: | https://doi.org/10.1145/1899412.1899417 |
| DOI: | https://doi.org/10.1145/1899412.1899417 |
| DBLP: | journals/tist/WuHJZY11 |
| BibTeX: |
@article{wu-2011-distance,
author = {Lei Wu and
Steven C. H. Hoi and
Rong Jin and
Jianke Zhu and
Nenghai Yu},
title = {{Distance metric learning from uncertain side information for automated photo tagging}},
journal = {ACM Transactions on Intelligent Systems and Technology (TIST)},
volume = {2},
number = {2},
pages = {13:1--13:28},
year = {2011},
url = {https://doi.org/10.1145/1899412.1899417},
doi = {https://doi.org/10.1145/1899412.1899417}
}