Joint Representation Learning with Relation-Enhanced Topic Models for Intelligent Job Interview Assessment.

Dazhong Shen|Chuan Qin|Hengshu Zhu|Tong Xu|Enhong Chen|Hui Xiong


Anthology ID:DBLP:journals/tois/ShenQZXCX22
Year:2022
Venue:ACM Transactions on Information Systems (TOIS)
Pages:15:1-15:36
URL:https://doi.org/10.1145/3469654
DOI:https://doi.org/10.1145/3469654
DBLP:journals/tois/ShenQZXCX22
BibTeX:
@article{shen-2022-joint, author = {Dazhong Shen and Chuan Qin and Hengshu Zhu and Tong Xu and Enhong Chen and Hui Xiong}, title = {{Joint Representation Learning with Relation-Enhanced Topic Models for Intelligent Job Interview Assessment}}, journal = {ACM Transactions on Information Systems (TOIS)}, volume = {40}, number = {1}, pages = {15:1--15:36}, year = {2022}, url = {https://doi.org/10.1145/3469654}, doi = {https://doi.org/10.1145/3469654} }