Jie Pu

2020

doi dblp
Contextual Anomaly Detection in Solder Paste Inspection with Multi-Task Learning.
Zimu Zheng|Jie Pu|Linghui Liu|Dan Wang|Xiangming Mei|Sen Zhang|Quanyu Dai
ACM Transactions on Intelligent Systems and Technology (TIST) 2020 Volume 11 Issue 6