From Data to Model in Bias: A Statistical Analysis of Political Bias in the C4 Corpus and Its Impact on LLMs.

Jaebeom You|Jaewon Lee|Sehun Lee|Hyuk-Yoon Kwon


Anthology ID:DBLP:conf/wsdm/YouLLK26
Volume:Proceedings of the Nineteenth ACM International Conference on Web Search and Data Mining, WSDM 2026, Boise, ID, USA, February 22-26, 2026
Year:2026
Venue:Web Search and Data Mining (WSDM)
Publisher:ACM
Pages:860-870
URL:https://doi.org/10.1145/3773966.3777990
DOI:https://doi.org/10.1145/3773966.3777990
DBLP:conf/wsdm/YouLLK26
BibTeX:
@inproceedings{you-2026-data, author = {Jaebeom You and Jaewon Lee and Sehun Lee and Hyuk-Yoon Kwon}, title = {{From Data to Model in Bias: A Statistical Analysis of Political Bias in the C4 Corpus and Its Impact on LLMs}}, booktitle = {{Proceedings of the Nineteenth ACM International Conference on Web Search and Data Mining, WSDM 2026, Boise, ID, USA, February 22-26, 2026}}, pages = {860--870}, publisher = {ACM}, year = {2026}, url = {https://doi.org/10.1145/3773966.3777990}, doi = {https://doi.org/10.1145/3773966.3777990} }