Sehun Lee

2026

doi dblp
From Data to Model in Bias: A Statistical Analysis of Political Bias in the C4 Corpus and Its Impact on LLMs.
Jaebeom You|Jaewon Lee|Sehun Lee|Hyuk-Yoon Kwon
Proceedings of the Nineteenth ACM International Conference on Web Search and Data Mining, WSDM 2026, Boise, ID, USA, February 22-26, 2026